An easy-to-use, cost-effective manufacturing test solution using RWC5020x for LoRa products, which is applicable to both end-devices and gateways.
Please find below a practical example with two different test methods – the “NST” mode for separate TX / RX tests and the “MFG” mode for combined TX / RX tests.
Either mode can be chosen in consideration of cost and time in your test environment. Provided are the source codes of the example as well as all the remote control libraries for free of charge.
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