An easy-to-use, cost-effective manufacturing test solution using RWC5020x for LoRa products, which is applicable to both end-devices and gateways.
Below is a practical example with two different test methods – the “NST” mode for separate TX / RX tests and the “MFG” mode for combined TX / RX tests. Both modes can be selected for cost and time considerations in your test environment. The source codes of the example and all the remote control libraries are provided for free of charge.
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